非接触智能卡兼容性测试系统设计  

Design of contactless smart card compatibility test system

作　　者：王丰 刘丽丽 

机构地区：[1]北京中电华大电子设计有限责任公司射频识别芯片检测技术北京市重点实验室,北京102209

出　　处：《微型机与应用》2017年第14期64-67,共4页Microcomputer & Its Applications

摘　　要：主要介绍了非接触智能卡兼容性测试方法及测试系统设计,重点阐述非接触智能卡兼容性测试存在的问题,并针对问题提出兼容性测试方法及兼容性测试系统的设计实现。该设计为非接触智能卡兼容性测试积累经验,以期降低非接触智能卡产品应用的兼容性风险。This paper mainly introduced the method and design of contactless smartcard compatibility test system. As the purpose of this paper, we will mainly discuss the problem of thecontactless smartcard compatibility test, and put a contactless compatibility solution and design to the current problem. We gather experiences for the compatibility test of the contactless smartcard, and hope these experiences can reduce compatibility risk occur of the smartcard products.

关 键 词：非接触智能卡 兼容性测试 非接触读卡器 

分 类 号：TP393.08[自动化与计算机技术—计算机应用技术]