基于X-pinch丝负载的背光照相研究  

Study on X-ray Backlighting of Wire Load X-pinch

作　　者：邹俭[1] 曾乃工[1] 王川[1] 张天爵[1] ZOU Jian ZENG Nai-gong WANG Chuan ZHANG Tian-jue(China Institute of Atomic Energy, P. O. Box 275-3, Beijing 102413, China)

机构地区：[1]中国原子能科学研究院串列加速器升级工程部,北京102413

出　　处：《原子能科学技术》2017年第8期1484-1487,共4页Atomic Energy Science and Technology

基　　金：中国核工业集团公司龙腾2020项目资助(HXLT201601)

摘　　要：以天光Ⅱ-B装置(250kA/50ns)作为实验平台,在装置负载的阴阳极和回流盘上同时安装X-pinch丝负载,利用天光Ⅱ-B驱动X-pinch丝负载,通过背光照相实验获得箍缩发展不同时刻的序列图像。在序列图像中可观察到箍缩叉点处等离子体的内爆及外爆消散。实验结果有助于进一步理解丝负载箍缩等离子体发展的物理机制。The experiments were carried out on the pulsed power generator LightⅡ-B（250 kA/50 ns）.The wire load X-pinch was installed on the cathode and anode of the device and the current-return rod.LightⅡ-B was used to drive the wire load X-pinch.A series of backlighting images could be clearly seen at different moments during wire load X-pinch discharge.The implosion and explosion of plasma near the cross point of the wire load X-pinch can be seen.The study can provide a better understanding about plasma physics formation of wire load X-pinch.

关 键 词：X-PINCH 等离子体 背光照相 

分 类 号：TL515[核科学技术—核技术及应用]