Cost-effective testing based fault localization with distance based test-suite reduction  

作　　者：Xingya WANG Shujuan JIANG Pengfei GAO Xiaolin JU Rongcun WANG Yanmei ZHANG 

机构地区：[1]School of Computer Science and Technology, China University of Mining and Technology [2]School of Computer Science and Technology, Nantong University [3]Guangxi Key Laboratory of Trusted Software, Guilin University of Electronic Technology

出　　处：《Science China(Information Sciences)》2017年第9期159-173,共15页中国科学（信息科学）（英文版）

基　　金：supported by National Natural Science Foundation of China (Grant Nos. 61673384, 61502497, 61562015);Guangxi Key Laboratory of Trusted Software (Grant Nos. kx201609, kx201532);Scientific Research Innovation Project for Graduate Students of Jiangsu Province (Grant No. KYLX 1390);Science and Technology Program of Xuzhou (Grant No. KC15SM051);China Postdoctoral Science Foundation (Grant No. 2015M581887)

摘　　要：The aim of testing based fault localization （TBFL） involves improving the efficiency of program debugging by providing developers with a guide of ranked list of suspicious statements. However, collection of testing information of the whole original test-suite is excessively expensive or even infeasible for developers to conduct TBFL. Traditional test-suite reduction （TSR） techniques are utilized to reduce the size of test- suite. However, they entail a time-consuming process of whole testing information collection. In this study, the distance based test-suite reduction （DTSR） technique is proposed. As opposed to the whole testing information, the distances among the test cases are used to guide the process of test-suite reduction in DTSR. Hence, it is only necessary to collect the testing information for a portion of the test cases for TSR and TBFL. The investigation on the Siemens and SIR benchmarks reveals that DTSR can effectively reduce the size of the given test-suite as well as the time cost of TBFL. Additionally, the fault locating effectiveness of DTSR results is close to that when the whole test-suite is used.The aim of testing based fault localization （TBFL） involves improving the efficiency of program debugging by providing developers with a guide of ranked list of suspicious statements. However, collection of testing information of the whole original test-suite is excessively expensive or even infeasible for developers to conduct TBFL. Traditional test-suite reduction （TSR） techniques are utilized to reduce the size of test- suite. However, they entail a time-consuming process of whole testing information collection. In this study, the distance based test-suite reduction （DTSR） technique is proposed. As opposed to the whole testing information, the distances among the test cases are used to guide the process of test-suite reduction in DTSR. Hence, it is only necessary to collect the testing information for a portion of the test cases for TSR and TBFL. The investigation on the Siemens and SIR benchmarks reveals that DTSR can effectively reduce the size of the given test-suite as well as the time cost of TBFL. Additionally, the fault locating effectiveness of DTSR results is close to that when the whole test-suite is used.

关 键 词：program debugging fault localization test-suite reduction distance estimation category partition 

分 类 号：TP311.53[自动化与计算机技术—计算机软件与理论]