电子束电偏转实验中亮斑的线度研究  

The length study of bright spots in the electric deflection of electron beam

作　　者：陈杰[1] 朱占武[1] 张琴[1] 刘国营[1] 张西平[1] 吴云沛[1] 

机构地区：[1]湖北汽车工业学院理学院,湖北十堰442002

出　　处：《大学物理》2017年第8期38-40,共3页College Physics

基　　金：校质量工程项目(JX201616);湖北省教育厅项目(16Y105;B2016085)资助

摘　　要：从理论上研究了"电子束电偏转实验"中亮斑的形成原因及其线度的影响因素,推导出电子流偏转总量x、亮斑线度Δ的表达式,并进行了数值模拟.研究结果表明,亮斑是由射入偏转电场的锥形电子束(其锥角Δθ实为一很小的量)引起,而造成Δ随加速电压U_1、偏转电压U_x变化的原因是由于Δθ关于偏转电场中心轴(z轴)的不对称分布.Δ的大小还取决于Δθ的大小.In the electric deflection of electron beam, the causes of bright spots and the factors of spots length are studied theoretically. The total expression x, of electron flow deflection and the length A, of bright spots are ob- tained and simulated numerically. The results show that bright spots are caused by the conical electron i}eam introduced into deflection field （the angle Δθ,of conical electron beam is very small） , and the reason of A varying with the change of accelerating voltage U,, deflection voltage Ux is Δθ asymmetry distribution on the central axis of deflection field. Also,A depends on the value of Δθ.

关 键 词：电子束 电偏转 亮斑线度 

分 类 号：O463.1[机械工程—光学工程]