用于X射线诊断的晶体布喇格成像系统  

X-ray Backlighting Imaging Bragg Spectrometer for X-ray Diagnosis

作　　者：刘利锋[1] 肖沙里[2] 钱家渝[2] 

机构地区：[1]山西大同大学物理与电子科学学院,山西大同037009 [2]重庆大学光电技术及系统教育部重点实验室,重庆400030

出　　处：《光子学报》2017年第8期60-64,共5页Acta Photonica Sinica

基　　金：国家自然科学基金(No.10976033)资助~~

摘　　要：为了评估惯性约束聚变实验中激光辐射驱动的对称性和均匀性,分析靶丸的运动过程,设计一种新型诊断单色X射线的弯曲晶体布喇格成像系统,该系统核心部件由色散元件球面弯曲晶体和探测装置组成.利用光线追踪软件对该成像系统进行模拟验证,并搭建了晶体布喇格成像系统进行X射线背光成像测试实验.实验获得了清晰的Cr靶单色X射线背光二维网格信息,石英球面晶体布喇格成像系统空间分辨率为83μm,表明该成像系统可以用于等离子体X射线的背光成像诊断.A novel X-ray backlighting imaging Bragg spectrometer was developed based on the Bragg diffraction theory to study and diagnose the driven symmetry and uniformity of laser radiation,analyse the promote layer motor process of target implosion of Inertial Confinement Fusion.The key component of the imaging system was the spherically bent Quartz Bragg crystal.The imaging simulation of the Xray backlighting imaging Bragg spectrometer was studied with the ray tracing software SHADOW.The monochrome X-ray backlight imaging experiment using spherically bent Quartz Bragg crystal was used to carried out in the Chinese Academy of Engineering Physics.The imaging plate was obtained the twodimensional,monochromatic backlight mesh imaging.By analyzing the imaging information of the experiment,the spatial resolution of the imaging Bragg spectrometer was 83μm.The experiment show that the imaging system was adequate for X-ray backlighting imaging diagnosis..

关 键 词：球面弯曲晶体 布喇格成像 X射线成像 空间分辨率 背光成像诊断 

分 类 号：O433.1[机械工程—光学工程]