希捷瓦记录磁盘评测  

Test and evaluation of Seagate SWD

作　　者：张强[1,2] 刘振军[1] 董欢庆[1] 马留英[1,2] 李猛坤[3] 

机构地区：[1]中国科学院计算技术研究所,北京100190 [2]中国科学院大学,北京100049 [3]首都师范大学管理学院,北京100045

出　　处：《高技术通讯》2017年第5期416-425,共10页Chinese High Technology Letters

基　　金：中国科学院战略性先导科技专项(XDA06010401);中国科学院重点部署项目(KGZD-EW-103-5(7));北京市教育委员会科技计划(km201510028019)资助项目

摘　　要：分析了可提升磁盘存储密度的瓦记录(SMR)技术的优势及局限性,指出SMR采用部分叠加相邻磁道的方式增大磁盘的面密度,但是这也带来了写覆盖(Write Overlay)问题,即更新某一磁道上的数据时会覆盖相邻磁道上的有效数据,导致瓦记录磁盘(SWD)无法支持原地更新,使其非顺序写性能受到影响。为了促进该技术的应用,通过Fio和Filebench测试工具,对SMR技术的代表性产品——希捷瓦记录磁盘(SSWD)做了比较全面的测试,并对多种应用场景下SSWD的性能做了详细的测试和分析,以便为SSWD在数据中心的应用提供重要的参考。The advantages and limitations of the shingled magnetic recording （SMR） technique which can enhance the disk storage density were analyzed, and it was pointed that SMR adopts the way of partially overlapping adjacent tracks to increase the areal density of the disk, but this brings the write overlay problem, that is when updating a track＇ s data, adjacent tracks＇ effect data can be covered, thus leading that the shingled write disk （SWD） can not support in-place update and the non-sequential writing performance can be affected. To promote the application of this SMR technique, the testing tools of Fio and Filebench were used to more comprehensively test the Seagate S shingled write disk （SSWD）, a representative product of the SMR technique, and its performance in variety of ap- plication scopes was analyzed to privide useful references for SSWD＇ s applications.

关 键 词：瓦记录(SMR) 瓦记录磁盘 写覆盖 原地更新 

分 类 号：TP333.3[自动化与计算机技术—计算机系统结构]