导电硅胶屏蔽效能长期可靠性试验研究  

Study on Long-term Reliability Test of Shielding Effectiveness for Conductive Silica Gasket

作　　者：雷震[1] 蒋全兴[2] 

机构地区：[1]华为技术有限公司 [2]东南大学电磁兼容研究所

出　　处：《安全与电磁兼容》2017年第4期73-75,共3页Safety & EMC

摘　　要：为了缩短试验时间、量化不同环境条件下导电硅胶屏蔽效能随时间的变化趋势,采用加速老化试验方法,对导电硅胶进行高温高湿强化环境试验,获得导电硅胶屏蔽效能下降趋势,进而预测在不同自然环境中更长时间轴上导电硅胶的屏蔽效能。结果表明,1 000小时的加速试验等效约15.53年,导电硅胶的屏蔽效能下降约20 dB。In order to shorten the test time and quantitfy the change trend of the shielding effectiveness of the conductive silica gasket withtime under different environmental conditions, the accelerating aging test method was used. Conductive sihca gasket samples are placed in high temperature and high hu,nidity environment for strengthening test, to obtain conductive silica shielding effectiveness of the downward trend. It is predicted that the shielding effectiveness trend of conductive silica gasket on the longer time axis in different natural envitxmments will also provide the basis for the design of shielding effectiveness. The results show that the 1000-hour acceleration test is equivalent to about 15.5 yems, the shielding effectiveness of conductive silica decreased by about 20 dB.

关 键 词：导电硅胶 屏蔽效能 长期可靠性 加速老化试验 

分 类 号：TB34[一般工业技术—材料科学与工程] TN03[电子电信—物理电子学]