少胶VPI绝缘结构的老化试验  

Aging Test on Few Glue VPI Insulation System

作　　者：施小豹 

机构地区：[1]安徽皖南电机股份有限公司,242500

出　　处：《电机技术》2017年第4期43-47,共5页Electrical Machinery Technology

摘　　要：通过对不同的无溶剂绝缘树脂、少胶云母带和绝缘工艺等进行对比和研究,筛选出了合适的绝缘材料、绝缘结构和绝缘工艺。并通过热老化试验,确定了阿仑尼乌斯图,求出了该绝缘结构的温度指数。Proper insulating materials, structure and technology were screened out through comparison and study on different insulating resin without solvent, dry mica tape and insulation technology. The Arrhenius chat was confirmed through the thermal aging test and temperature index of this insulating structure was achieved.

关 键 词：绝缘树脂 H级少胶绝缘系统 少胶云母带 热老化 温度指数 

分 类 号：TM304[电气工程—电机]