纳米颗粒近场空间光谱散射建模与显微成像分析  

Analysis on Near Field Spatial Spectra Scattering Modeling of Metallic Nanoparticle and Microscopic Imaging

作　　者：刘国彦 高昆[2] 刘学峰[3] 倪国强[2] LIU Guo-yan GAO Kun L NI Guo-qiang(College of Engineering and Technology, Tianjin Agricultural University, Tianjin 300384, China Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China)

机构地区：[1]天津农学院工程技术学院,天津300384 [2]北京理工大学光电成像技术与系统教育部重点实验室,北京100081 [3]南京理工大学电子工程与光电技术学院,江苏南京210094

出　　处：《光谱学与光谱分析》2017年第9期2662-2666,共5页Spectroscopy and Spectral Analysis

基　　金：国家自然科学基金项目(61271427)资助

摘　　要：用非直观偏振参数显微成像,即采用在传统显微光路中插入模式化装置,通过拟合过滤后对所得数据反演成像,通过对金属纳米颗粒在近场空间散射光谱分析,来解决空间散射现象。用非直观偏振参数显微成像与传统直观成像做对比,并通过时域有限差分法建模仿真,来描述近场直观与非直观散射光谱的差异,对比结果发现,非直观偏振参数显微反演成像的分辨率比直观成像更高,不但能够清晰的探测到纳米颗粒的形状和电场分布,而且比直观成像获得更广泛的空间散射光谱。Polarization parameters indirect microscopic imaging,which utilizes conventional microscope as a basic light path and inserts modulations into the light path,finally,the inversion images are obtained after fitting and filtering the data obtained from the system.By analyzing the near-field spatial spectra scattering around nanoparticles to solve spatial spectra scattering.Comparing polarization parameters indirect microscopic imaging with direct imaging by using FDTD modeling,it can be found that the resolution of polarization parameters indirect microscopic imaging is much higher than conventional imaging and it can not only detect the shape and electric field distribution of nanoparticles,but also obtain much wider spatial scattering spectra.

关 键 词：近场散射 空间光谱 显微成像 

分 类 号：O433.4[机械工程—光学工程]