平面近场测试中误差的分析  

Analysis of errors in PNF measurements

作　　者：陈玉林 李辉煌 Chen Yulin Li Huihuang(Key Laboratory of Aperture Array and Space Application, Hefei 230088,Anhui,Chin)

机构地区：[1]孔径阵列与空间探测安徽省重点实验室,安徽合肥230088

出　　处：《航天电子对抗》2017年第4期51-53,共3页Aerospace Electronic Warfare

摘　　要：首先介绍了暗室中主要的误差项,然后通过实际测试的方式,分析了其中四项误差对超低副瓣天线-50dB副瓣的不确定度。结果对超低副瓣天线副瓣的误差分析有一定的参考意义,有助于天线设计师了解超低副瓣天线测试中误差项对副瓣的影响量级。The main errors in chamber are introduced firstly.Then,the uncertainty of-50 dB sidelobe caused by the four errors in chamber is obtained by the means of actual measurements.The results have some reference meaning to the error analysis of ultra-low sidelobe antenna,and can help the antenna designer to know the effect of errors on the sidelobe in ultra-low sidelobe antenna measurements.

关 键 词：平面近场测试 误差分析 超低副瓣天线 

分 类 号：TN820[电子电信—信息与通信工程]