机构地区:[1]Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China [2]Department of Dermatology, The Sixth People's Hospital of Shenzhen, Shenzhen 518052, China [3]Department of Pathology, The Sixth People's Hospital of Shenzhen, Shenzhen 518052, China [4]Bioimaging Core, Faculty of Health Sciences, University of Macao, Taipa, Maeau SAR China
出 处:《Chinese Optics Letters》2017年第9期20-24,共5页中国光学快报(英文版)
基 金:supported by the National Basic Research Program of China(No.2015CB352005);the National Natural Science Foundation of China(Nos.61525503,61378091,and 61620106016);the Guangdong Natural Science Foundation Innovation Team(No.2014A030312008);the Hong Kong,Macao and Taiwan cooperation innovation platform&major projects of international cooperation in Colleges and the Universities in Guangdong Province(No.2015KGJHZ002);the Shenzhen Basic Research Project(Nos.JCYJ20150930104948169,JCYJ2016032814 4746940,and GJHZ20160226202139185)
摘 要:The aim of this study is to develop a novel technique for improving the intraoperative margin assessment of glioblastoma by examining the total extrinsic extracellular matrix(ECM) with eosin staining using fluorescence lifetime imaging microscopy(FLIM) and scale-invariant feature transform(SIFT) descriptor analysis. Pseudocolor FLIM images obviously exhibit ECM distributions, changes in sequential sections, and different regions of interest. Meanwhile, SIFT descriptors are first utilized for the discrimination of glioblastoma margins by matching similar ECM regions and extracting keypoint orientations from FLIM images obtained from a series of continuous slices. The findings indicate that FLIM imaging with SIFT analysis of the total ECM is a promising method for improving intraoperative diagnosis of frozen and surgically excised brain specimen sections.The aim of this study is to develop a novel technique for improving the intraoperative margin assessment of glioblastoma by examining the total extrinsic extracellular matrix(ECM) with eosin staining using fluorescence lifetime imaging microscopy(FLIM) and scale-invariant feature transform(SIFT) descriptor analysis. Pseudocolor FLIM images obviously exhibit ECM distributions, changes in sequential sections, and different regions of interest. Meanwhile, SIFT descriptors are first utilized for the discrimination of glioblastoma margins by matching similar ECM regions and extracting keypoint orientations from FLIM images obtained from a series of continuous slices. The findings indicate that FLIM imaging with SIFT analysis of the total ECM is a promising method for improving intraoperative diagnosis of frozen and surgically excised brain specimen sections.
关 键 词:ECM Implementation of FLIM and SIFT for improved intraoperative delineation of glioblastoma margin
分 类 号:R11[医药卫生—公共卫生与预防医学]
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