利用红外热像仪进行物体表面波段法向发射率测量  

Surface Band Normal Emissivity Measurement Using Infrared Thermal Imager

作　　者：李岩峰 张志杰 赵晨阳[1] 郝晓剑 

机构地区：[1]中北大学仪器与电子学院,太原030051 [2]中北大学仪器科学与动态测试教育部重点实验室,太原030051

出　　处：《传感技术学报》2017年第9期1348-1351,共4页Chinese Journal of Sensors and Actuators

基　　金：国家自然科学基金面上项目(51575499;61473267);技术基础科研项目(JSJC2013408C009)

摘　　要：辐射测温法以其响应速度快、测温范围广的特点得到广泛应用,发射率是影响辐射测温精度的主要参数。实际条件中,不同物体、相同物体不同表面温度及表面状况其发射率是不同的。为获得实际物体的表面波段法向发射率,提高测温精度,采用红外热像仪对其进行测量。在介绍红外热像仪测温原理的基础上,通过分析得出红外热像仪测量发射率的方法。由于红外热像仪探测器、工作波段和测温范围的不同,发射率计算公式中n值也是不同的,对应用的红外热像仪在不同测温范围内的n值进行了计算。应用红外热像仪和比色测温仪对高温陶瓷表面波段法向发射率进行了测量,并对其进行了验证。实验结果表明该方法测得的表面波段法向发射率是可靠的,其修正后测温误差小于1%。The radiation thermometry is widely used because of fast response and wide range of temperature measurement,and emissivity is the main parameter that affects the accuracy of radiation thermometry. The emissivity of different objects and same object with different surface temperatures and conditions is different in fact. In order to obtain the surface band normal emissivity of the object and improve the accuracy,infrared thermal imager is used.The temperature measurement principle of infrared thermal imager was introduced,and then the emissivity measurement method was proposed. In view of different detectors,working bands and temperature measurement ranges of infrared thermal imager,the n values are different in emissivity calculation formula. n values for the applied infrared thermal imager in different temperature ranges were calculated. The infrared thermal imager and the colorimetric pyrometer were used to measure the surface band normal emissivity of the high temperature ceramics,and the result was verified. Experimental results show that the band normal emissivity measured by this method is reliable,and the temperature measurement error is less than 1% after correction.

关 键 词：辐射测温 发射率 红外热像仪 比色测温仪 

分 类 号：TN219[电子电信—物理电子学]