Nested grazing incidence optics for x ray detection  

作　　者：李林森 强鹏飞 盛立志 刘永安 刘哲 刘舵 赵宝升 张淳民 

机构地区：[1]University of Chinese Academy of Sciences [2]School of Science Xi’an Jiaotong University [3]State Key Laboratory of Transient Optics and Photonics Xi’an Institute of Optics and Precision Mechanics

出　　处：《Chinese Physics B》2017年第10期152-156,共5页中国物理B（英文版）

基　　金：supported by the National Natural Science Foundation of China(Grant No.61471357);the State Key Laboratory of Geo-Information Engineering Foundation(Grant No.SKLGIE2014-M-2-1)

摘　　要：Grazing incidence optics （GIO） is the most important compound in an x-ray detection system; it is used to concentrate the x-ray photons from outer space. A nested planar GIO for x-ray concentration is designed and developed by authors in this paper; planar segments are used as the reflection mirror instead of curved segments because of the simple process and low cost. After the complex assembling process with a special metal supporter, a final circle light spot of φ 12 mm was obtained in the visible light testing experiment of GIO; the effective area of 1710.51 mm^2@ 1 keV and 530 mm^2@8 keV is obtained in the x-ray testing experiment with the GIO-SDD combination, which is supposed to be a concentrating detector in xray detection systems.Grazing incidence optics （GIO） is the most important compound in an x-ray detection system; it is used to concentrate the x-ray photons from outer space. A nested planar GIO for x-ray concentration is designed and developed by authors in this paper; planar segments are used as the reflection mirror instead of curved segments because of the simple process and low cost. After the complex assembling process with a special metal supporter, a final circle light spot of φ 12 mm was obtained in the visible light testing experiment of GIO; the effective area of 1710.51 mm^2@ 1 keV and 530 mm^2@8 keV is obtained in the x-ray testing experiment with the GIO-SDD combination, which is supposed to be a concentrating detector in xray detection systems.

关 键 词：x ray detection grazing incidence optics planar segments concentrating detector 

分 类 号：O434.1[机械工程—光学工程]