最优化分支覆盖测试路径集研究与应用  

Application of Optimization Methods and Test Path Set for Branch Coverage Testing

作　　者：石磊[1] 翁鹤 SHI Lei WENG He(Luoyang Optoelectronic Technology Development Center, Luoyang 471099,China)

机构地区：[1]洛阳光电技术发展中心,河南洛阳471099

出　　处：《软件导刊》2017年第10期154-158,共5页Software Guide

摘　　要：基于DD图理论能够获取覆盖整个路径的分支测试路径集合,但缺少精简无约束边集合的方法,分支测试用例选取复杂,工程应用更少。在DD图提炼无约束边集合的基础上,对程序路径树进行研究,提出通过循环计算路径树未被选中路径中包含的未被覆盖无约束边的个数,实现最优化分支覆盖测试路径集选择方法,满足基于DO-178B和GJB/Z 141军用软件语句、分支和MC/DC测试覆盖指标要求。实际工程应用结果表明,该方法实现了优化测试用例,满足了测试充分性要求。Despite the fact that theories based on DD-graph could acquire a set of branch testing path that cover the whole path, it lacks the method in simplifying the extracted free edges set, and the choice of test cases could be completed, hence fewer application in engineering. This paper researches on program path tree on the basis of the extracted free edges set from DD graph, optimizing the test path set for branch coverage testing through computing the number of unused free edges from the unchosen path in path tree repeatedly up to the standard of military software statement, branch and MC/DC coverage testing basing on DO-178B and GJB/Z 141,thus meeting the requirement of test sufficiency with an adequate set of optimized test cases. Moreover, the results of practical applications in engineering prove the feasibility of this method.

关 键 词：DD图 无约束边 路径树 分支覆盖测试 

分 类 号：TP319[自动化与计算机技术—计算机软件与理论]