基于EMTP/ATP电容器组故障跳闸原因分析  

Analysis on Capacitor Bank Fault Trip Based on EMTP/ATP

作　　者：邱太洪 王俊波 李国伟 洪贞贤 孔淑琴 黄伟东 

机构地区：[1]广东电网有限责任公司佛山供电局,广东佛山528000

出　　处：《电力电容器与无功补偿》2017年第5期17-21,共5页Power Capacitor & Reactive Power Compensation

摘　　要：通过对某110 k V变电站21C电容器组故障跳闸的检查试验、故障录波分析以及EMTP/ATP仿真计算,找出造成该电容器故障的原因主要有:一是B5电容器在合闸前便存在绝缘薄弱的缺陷,一经合闸发生绝缘击穿;二是B5电容器的熔断器在合闸前存在接触不良缺陷,一经合闸熔断器内部发生间隙放电,受高频放电电流的作用B5电容器发生击穿。引入EMTP/ATP仿真计算为电容器类似故障原因分析提供新的方法,积累经验,具有一定的工程实际意义。The fault reason of capacitor is found through the inspection and test of the tripping, fault record wave analysis and EMTP/ATP simulation calculation of 21C capacitor bank of certain a 110 kV substation as follows：The first reason is that B5 capacitor has the defect of weak insulation before closing operation and, in case of closing operation, the insulation breakdown occurs; the second one is that the fuse of B5 capacitor has the defect of weak contact before closing operation and, in case of closing operation, the gap discharges occurs inside the fuse and therefore the B5 capacitor occurs breakdown due to the action of high frequency discharge current.The EMTP/ATP simulation calculation is introduced so to provide new method for the analysis of the similar fault of capacitor, accumulate experience, which has a definite engineering practical significance.

关 键 词：电容器组 故障跳闸 原因分析 EMTP/ATP 

分 类 号：TM53[电气工程—电器]