电子倍增器的加速试验方法及其寿命预测研究  

Research on Accelerated Test Method of Electron Multiplier and Its Life Prediction

作　　者：汪亚顺[1] 陈循[1] 陶俊勇[1] 张书锋[1] 张春华 WANG Yashun CHEN Xun TAO Junyong ZHANG Shufeng ZHANG Chunhua(National University of Defense Technology, Changsha 410073, China Hunan Institute of Information Technology, Changsha 410151, China)

机构地区：[1]国防科技大学,湖南长沙410073 [2]湖南信息学院,湖南长沙410151

出　　处：《电子产品可靠性与环境试验》2017年第5期35-41,共7页Electronic Product Reliability and Environmental Testing

摘　　要：对电子倍增器的加速试验方法及其寿命预测理论进行了研究。首先,建立了电子倍增器加速退化试验系统,设计了加速退化试验方案;然后,对电子倍增器进行了加速退化试验;最后,提出了电子倍增器的双恒定应力加速退化试验数据的分析方法,并对分析结果进行了模型检验分析,验证了该方法的有效性。The accelerated test method of electron multiplier and its are studied. Firstly, the accelerated degradation test system for the life prediction theory electron multiplier is established, and the accelerated degradation test scheme is designed. And then, the accelerated degradation test is carried out for electron multiplier. Finally, an analysis method for double constant stress accelerated degrada analysis results are analyzed through tion test data of electron multiplier is proposed, and the model test, and the validity of the method is verified.

关 键 词：电子倍增器 加速退化试验 寿命预测 可靠性 

分 类 号：TN103[电子电信—物理电子学]