真空灭弧室CuCr触头材料发射率研究  

Emissivity of CuCr Contact Materials for Vacuum Interrupters

作　　者：刘思远[1] 王振兴[1] 王建华[1] 耿英三[1] 刘志远[1] LIU Si-yuan WANG Zhen-xing WANG Jian-hua GENG Ying-san LIU Zhi-yuan(State Key Laboratory of Electrical Insulation and Power Equipment, Xi＇an Jiaotong University, Xi＇an 710049, China)

机构地区：[1]西安交通大学电力设备电气绝缘国家重点实验室,西安710049

出　　处：《电工材料》2017年第5期3-7,11,共6页Electrical Engineering Materials

基　　金：973项目2015CB251002;国家自然科学基金项目51177122;51323012;51221005

摘　　要：真空灭弧室触头温度是影响其开断能力的重要因素之一,非接触式温度测量手段以其反应时间快,测量范围宽,测量精度高,不干扰等离子体分布等优点被应用于真空灭弧室触头温度测量中。触头材料发射率是材料本身的物性参数之一,也是非接触式温度测量中推算温度所需的基本参数之一,只有在测得材料发射率的情况下才能根据光谱强度推算出材料表面温度。本研究的目标是测量得到真空灭弧室6种常用触头材料Cu、CuCr(25)、CuCr(30)、CuCr(40)、CuCr(45)、CuCr(50)的发射率。利用黑体辐射参考源在中温黑体炉中进行光谱测量,检测波长范围从5~20μm,加热温度为400~800℃。得到测量波长在5~7μm范围内为发射率测量值最稳定,适合用于触头温度非接触式测量。测得5~7μm波长范围内上述6种触头材料在800℃时的发射率值分别为0.50、0.58、0.56、0.52,0.48和0.41。触头材料发射率随着材料表面粗糙程度的增加而增加;随着温度的上升触头材料发射率随之增加;铜铬合金触头的发射率会随着铬组分比例增加而下降。The objective of this paper is to investigate the emissivity of CuCr contact materials used in vacuum interrupters. The temperature of contacts has a significant influence on the vacuum interrupter interruption capability. Non-contact temperature measurement is applied to vacuum interrupter contact temperature measurement, as it has advantages of fast reaction, wide measuring range, high precision, and not interfere with the plasma distribution. The emissivity of the contact materials is one of the physical parameters of the material itself. It is also one of the basic parameters required for estimating the temperature of the non-contact temperature measurement. Six commonly used contact materials such as Cu, CuCr（25）, CuCr（30）, CuCr（40）, CuCr（45）,and CuCr（50） are tested for emissivity. As a result, the measuring wavelength in the range of 5~7 μm is the most stable for the emissivity measurement. The emissivity of the six materials is respectively, 0.50, 0.58, 0.56, 0.52, 0.48 and 0.41 under 800 ℃. The emissivity of the contactmaterials increases with the temperature and the material surface roughness. The emissivity of copper-chromium alloy contact decreases when the chromium content increases.

关 键 词：真空灭弧室 触头材料 材料发射率 非接触温度测量 

分 类 号：TM561.5[电气工程—电器]