某A/D转换器老化过程中端口异常失效分析  

The Failure Analysis on A Type of A/D Converter

作　　者：王媛 白璐[1] 詹勇 张盼盼 

机构地区：[1]中国电子科技集团第24研究所,重庆400060

出　　处：《环境技术》2017年第4期39-43,48,共6页Environmental Technology

摘　　要：近年来,关于电子元器件的失效分析技术对于产品的生产和使用具有越来越重要的意义。作为模拟IC设计、生产单位,通过试验验证和分析找到失效原因,发现产品设计、测试、生产过程中存在的问题,以不断改进产品设计和生产水平,提高产品的可靠性。本文通过对某A/D转换器老化后端口异常进行分析,发现该产品在老化试验条件的选择存在问题,文中不仅给出失效原因,同时提出了改进措施。此次失效分析表明产品老化试验可靠性的评价以及风险评估的重要性。In recent years, the technology about ＂Failure Analysis＂ is more and more important for the production and use of products. As a special design and manufacture institute, the cause of failure is found according to the experimental verification and analysis. The defects exist in design, testing, manufacturing must be found in order to improve the design and manufacturing level and raise the reliability of products. This paper is about the analysis of a type of A/D converter which is failure in the port exception when tested after the burning-in test, the problem which was found through failure analysis aims at the choosing for the condition of the burning-in test. The paper presents the cause of failure and gives the suggestions. The conclusions are instructive to the importance of reliability and risk evaluation of the burning-in test for the similar products.

关 键 词：A/D转换器 老化 金铝键合 失效分析 

分 类 号：TN306[电子电信—物理电子学]