冷屏对红外探测器组件降温影响研究  

Research on the influence of cold shield on the cooling process of infrared detector assembly

作　　者：孙闻[1,2] 夏晨希 李俊[1] 王小坤 

机构地区：[1]中国科学院上海技术物理研究所红外成像材料与器件重点实验室,上海200083 [2]中国科学院大学,北京100049

出　　处：《激光与红外》2017年第10期1286-1289,共4页Laser & Infrared

摘　　要：冷屏是制冷型红外探测器组件的重要组成部分并伴随探测器一起降温,所以不同技术状态冷屏对红外探测器组件降温会有影响。本文针对320×256 30μm规模红外探测器用F2冷屏,通过对不同技术状态冷屏在相同冷平台下的降温实验,研究对应技术状态冷屏对降温过程的影响情况,并获得了各冷屏技术状态对应的影响量。本文结果对优化冷屏热学设计有一定借鉴意义。The cold shield is an important part of the infrared detector assembly,and it will be cooled with the detector. Aiming at F2 cold shield for the 320 × 256,30 μm scale infrared detector,through cooling experiment with different technical conditions of cold shield in the same cold platform,the influence of the corresponding technical conditions of cold shield on the cooling process was studied,and the corresponding results were obtained under different technical conditions of cold shield. The results provide a reference for optimizing the thermal design of cold shield.

关 键 词：红外探测器 冷屏 制冷 

分 类 号：TN214[电子电信—物理电子学]