基于LED串联电阻的结温测量方法  

Estimation of Junction Temperature of LED Based on Its Series Resistance

作　　者：张家伟 刘一霖 王文峰[1] ZHANG Jia-wei LIU Yi-lin WANG Wen-feng(Faculty of Physics and Electronics, Hubei University, Wuhan 430062, Chin)

机构地区：[1]湖北大学物理与电子科学学院,湖北武汉430062

出　　处：《光学与光电技术》2017年第5期45-48,共4页Optics & Optoelectronic Technology

基　　金：武汉科技局(201304030710091)资助项目

摘　　要：理论分析了LED的电流/电压(I/V)特性与PN结结温的关系,揭示了温度函数的串联电阻项对I/V曲线的影响,并应用这一影响提出了一种基于串联电阻测量LED结温的方法。该方法只需多点记录LED工作状态的电流、电压值,对数据进行模型拟合就可以得出LED的结温,测试仪器要求低,测量过程简单,可与LED老化工艺同步进行,是一种简单、有效的批量检测LED结温的方法。利用该方法测量了6组LED灯具,测量结果与传统正向电压法的结果具有较高的一致性,证实了该方法的可行性。The relations between the current/voltage（I/V）characteristics and the junction temperature of LEDs are analyzed.The effects of temperature-dependent series resistance on the I/Vcurves is revealed.Based on the effects,a method of measuring LED junction temperature is proposed.By measuring several data of current/voltage of an LED on working condition,and then processing the data,the junction temperature can be estimated.Using this method,6 sets of LED lamps are measured.The results are agreed with the traditional method,which confirmes the feasibility of the method.

关 键 词：发光二极管 结温测量 正向电压法 串联电阻 电流电压曲线 半导体测量技术 

分 类 号：O482.31[理学—固体物理]