一款三相可控硅控制器芯片的测试  

Test of a Three-phase Thyristor Controller

作　　者：张永锋[1] 姜浩 杨影[1] ZHANG Yong-feng JIANG Hao YANG Ying(Dalian Nensoft University of Information, Dalian 116023, China)

机构地区：[1]大连东软信息学院,辽宁大连116023

出　　处：《中国集成电路》2017年第10期60-66,共7页China lntegrated Circuit

摘　　要：介绍了一款自主研发的基于Chartered 0.35μm CMOS工艺的用于三相交流调压和可控整流的可控硅控制器芯片。基于Chroma公司3360D测试台(ATE)对封装后芯片进行了测试,并详细阐述了DC、AC、DFT、功能测试等的测试方法,芯片测试良率达到94.7%。最后,通过现场板级验证,进一步验证了芯片工作的有效性。Based on Chartered 0.35 μm CMOS IC process, for three-phase ac voltage regulator and rectifier, a self- developed thyristor controller chip was introduced. Based on Chroma 3360D （ ATE ）, the packaged chip was tested, and DC, AC, DFT, function test methods were elaborated. The yield of this chip reached 94.7%. Finally, the effective- ness of the chip is verified by demo board in the experiment system.

关 键 词：可控硅控制器 DC测试 AC测试 DFT测试 功能测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]