基于测试充分性准则的非死锁并发缺陷定位方法  

Non-deadlock Concurrency Fault Localization Approach Based on Adequate Test Criteria

作　　者：陈诚[1] 郑征[1] 王皓钦 乔禹 

机构地区：[1]北京航空航天大学自动化科学与电气工程学院,北京100191

出　　处：《计算机科学》2017年第11期195-201,共7页Computer Science

摘　　要：并发程序的非确定性使得其调试工作异常困难。基于程序谱的软件缺陷定位方法虽然能够缓解该情况,但其定位结果依赖于调试信息。针对在此过程中难以获得调试信息及如何选择利用调试信息的问题,提出了一种基于测试充分性准则的缺陷定位方法,该方法包括3个部分:预测满足测试充分性准则的条件;制定相应的测试方案;将收集到的调试信息用于缺陷定位分析。依据此方法,用C#语言实现了缺陷定位工具——ConFinder。在含有实际并发缺陷的程序上进行实验,结果表明该方法可以有效找出引起程序失效的原因并且所得结果具有很好的稳定性。Concurrency programs are difficult to debug due to their congenital nondeterminism.Fault localization approaches may alleviate such situation.However,their performance heavily depends on the debug information.To alleviate this problem,we proposed a non-deadlock concurrency fault localization approach based on adequate test criteria.Our approach consists of three parts：aprediction of the conditions meeting an adequate test criteria,a scheme of a test plan satisfied with the criteria,and a fault localization analysis using the debug information.Besides,aprototype called ConFinder based on this approach was implemented in C#.Moreover,experiments on programs containing real concurrency bugs were carried out.The result shows that our approach can localize non-deadlock concurrency bugs effectively and has stable performance.

关 键 词：并发程序 软件测试 软件缺陷定位 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]