单点探测被动毫米波成像系统设计  

Single Detector Passive Millimeter Wave Imaging System

作　　者：李志豪[1] 刘伟豪[1] 李维姣[1] 丁志平[1] 

机构地区：[1]公安部第三研究所,上海200031

出　　处：《红外技术》2017年第11期979-982,共4页Infrared Technology

基　　金：上海市科研计划项目(13231203100)

摘　　要：被动毫米波成像是公共安全检查的一个重要发展方向,目前国内外主要集中在纯反射系统的多元探测成像,以及采用透射形式的阵列探测成像两个领域。本文采用单点探测加扫描的形式,设计完成一套低成本近场被动毫米波成像系统,实现探测距离1.5 m、成像范围1.2 m×1.2 m、空间分辨率优于1.5 cm。该系统可应用于各公共检查场所,实现非接触式安全检查。Passive millimeter wave imaging is an important application in the field of public security. Recently, researchers have concentrated their efforts on the reflex system with FPA, which involves high costs and increased difficulties in building off-axis paraboloidal mirrors of large enough dimensions. In this article, we present a passive millimeter wave imaging system with one HDPE lens and a single detector, which can produce an image within a range of 1.5 m, with an imaging area of 1.2 m×~ 1.2 m, and having a resolution greater than 1.5 cm. This system can be applied to public security and allows for non-contact safety inspections.

关 键 词：高斯波束 准光路系统 毫米波成像 单点探测 

分 类 号：TN015[电子电信—物理电子学] TB811.3[一般工业技术—摄影技术]