基于CMOS图像传感器的微透镜平移算法研究  

Research on Microlens Shifting Algorithm Based on CMOS Image Sensor

作　　者：武岩[1] 高春 魏巍 WU Yan;GAO Chun;WEI Wei(College of Computer Science and Technology, Changchun University of Science and Technology, Changchun 130022)

机构地区：[1]长春理工大学计算机科学技术学院,长春130022

出　　处：《现代计算机（中旬刊）》2017年第12期66-70,共5页Modern Computer

基　　金：基金项目:立体影像特征和字幕特征对立体视融合舒适度影响的脑机制研究(No.XJJLG-2016-19)

摘　　要：针对照射到CIS像素阵列边缘像素中光电二极管上的光照强度减弱,导致整个芯片的串扰增加以及灵敏度下降的问题,在分析几种微透镜平移算法的优缺点基础上,提出一种在保证平移精度的同时减少微透镜平移计算量的算法,并在光学仿真平台Light Tools软件上进行仿真测试及验证。该算法解决平移量计算不精确和计算量过大等问题,明显提高微透镜平移量的计算效率。In view of the light intensity of the photodiode in the pixel array of the CIS is weakened, which leads to the increase of the whole chip and the decrease of sensitivity. Based on the analysis of the advantages and disadvantages of several microlens shifting algorithms, proposes a new algorithm to reduce the calculation of microlens shifting and ensures the translational precision at the same time, and carries out the simulation test and verification on the optical simulation platform of LightTools software. The algorithm solves the problem of inaccurate calculation and the excessive computation of shifting quantity, the calculation efficiency of the microlens shifting is improved obviously.

关 键 词：CIS 微透镜平移 光学仿真 平移量 

分 类 号：TP212[自动化与计算机技术—检测技术与自动化装置]