多核微处理器实速故障诊断研究  

Research on At-Speed Fault Diagnosing for Multi-Core Microprocessors

作　　者：欧阳晴昊 曾凡仔 

机构地区：[1]湖南大学信息科学与工程学院,长沙410000

出　　处：《微电子学》2017年第6期861-865,871,共6页Microelectronics

摘　　要：针对多核微处理器面临的故障诊断问题,提出了一种基于带压缩扫描链的多核微处理器实速故障诊断方法。综合机台测试和软件诊断,在一种流片后的高速多核微处理器芯片上实现了诊断流程,验证了该方法对于故障诊断定位的有效性。通过故障定位可以加速机台测试调试过程的收敛;分析芯片频率-电压Shmoo图,对临界值附近的故障进行诊断定位、隔离检验。这些诊断研究可以为后续系列芯片频率提升起指导作用。Aimed at the fault diagnosis problems brought by multi-core microprocessors,an at-speed fault diagnosis method based on scan chain with compression logic was proposed.By combining ATE（Automatic-TestEquipment）test and software diagnosis,a diagnosis flow was implemented on a taped-out high frequency multi-core microprocessor,which had proved that the method was effective in fault diagnosis and fault location.It could accelerate the convergence of ATE test debugging flow through fault location.Furthermore,through analyzing the chip＇s frequency-voltage Shmoo picture,and doing the work of diagnosis location and isolation checkout on the faults with nearby critical value,it could provide a reference for improving the frequency of next series chips.

关 键 词：实速测试 EDT压缩 多核微处理器 故障诊断 

分 类 号：TN407[电子电信—微电子学与固体电子学]