太阳能光热薄膜热稳定性试验及其微观结构分析  

THE STUDY OF THERMAL STABILITY AND MICROSTRUCTURE ANALYSIS OF SOLAR THERMAL FIlMS

作　　者：张科 杜淼[1] 郝雷[1] 米菁[1] 孟建平[1] 郎宇帆 

机构地区：[1]北京有色金属研究总院能源材料与技术研究所

出　　处：《太阳能学报》2018年第1期64-68,共5页Acta Energiae Solaris Sinica

基　　金：国家科技支撑计划(2015BAA02B04)

摘　　要：对不同太阳能光热薄膜的热稳定性进行研究,并分析温度诱导的衰老行为。热稳定性初始测试在278℃下分别退火36、75、150、300和600 h。最终测试在308℃下退火342 h。薄膜的光学性能通过UV/VIS/NIR分光光度计和FTIR光谱仪分析,微观结构和成分变化由FESEM、XRD分析。结果表明,经退火薄膜出现微裂纹、微孔、起泡和脱落,以及新的氧化相,主要的衰老机制是元素的扩散和氧化。The thermal stability and temperature-induced degradation mechanisms of different solar thermal films were studied and analzsed in this work. The initial tests were annealed at 278 ℃ for 36,75,150,300 and 600 h, respectively. Final annealed is at 308 ℃ for 342 h. The optical properties of the film is analzsed by UV/VIS/NIR spectrophotometer, microstructure, composition analzsed by FESEM, EDS, XRD. The results showed that the main mechanism are diffusion and oxidation, as well as micro-structure, micro-cracks and pores play an important role in the aging process.

关 键 词：太阳能光热薄膜 热稳定性 失效机理 微结构变化 

分 类 号：TG144[一般工业技术—材料科学与工程]