用于Z箍缩功率密度测量的针孔阵列设计  

Design of Pinhole Array for Measurement of X-Ray Power Density

作　　者：王亮平[1,2] 张金海 李沫 郭宁[1,2] 

机构地区：[1]西北核技术研究所,西安710024 [2]强脉冲辐射环境模拟与效应国家重点实验室,西安710024

出　　处：《现代应用物理》2017年第4期10-15,共6页Modern Applied Physics

基　　金：国家自然科学基金资助项目(51237006)

摘　　要：针对"强光一号"加速器Z箍缩负载产生的总能量约40kJ软X射线功率密度测量问题,提出了利用针孔阵列对距离负载中心较近处试验面的功率密度进行衰减的物理方案,分析了针孔成像原理,设计了针孔阵列,计算了阵列衰减因数。分析计算结果表明,设计的针孔阵列可有效对软X射线功率密度进行衰减,衰减因数为4×10^(-6)。同时,该针孔阵列可对由磁流体力学不稳定性引起的Z箍缩软X射线辐射源成像光强不均匀现象起到匀化作用,从而使利用该针孔阵列对试验面功率密度进行测量具备了可行性。For measurement of the power density of soft X-ray radiated by Z pinch load on Qiangguang-I generator with a total energy of 40 kJ,apinhole array is designed to effectively decay the power density on the test plane which is very close to the Z pinch source.Based on the principle of the pinhole image,the configuration of the pinhole array is designed,and the attenuation coefficient of the pinhole array is calculated.The results show that the pinhole array is feasible to be used as an attenuator with attenuation coefficient of 4×10^(-6),and the pinhole array can also mitigate the non-uniformity of Z pinch X-ray source caused by magnetohydrodynamic(MHD)instability.The measurement of X-ray power density on the test plane is practical by adding apinhole array in the system.

关 键 词：Z箍缩 功率密度 针孔阵列 

分 类 号：TL99[核科学技术—核技术及应用]