超高频无源标签芯片测试方法研究  

Study on test methods of UHF passive RFID IC

作　　者：菅端端[1] 陈大为[1] 袁修华 

机构地区：[1]中国电子技术标准化研究院,北京100176

出　　处：《电子测量技术》2017年第12期68-74,共7页Electronic Measurement Technology

摘　　要：目的是完成超高频无源标签芯片测试中的步骤、条件、影响因素和注意事项的标准化工作,为相关标准引入国军标的决策提供支撑。通过调研国内超高频无源标签芯片的需求和研制现状,汇总分析目前国军标中标签芯片的性能评价试验要求。会同国内主要的标签芯片设计厂家研究标签芯片性能的测试方法,进而形成了《超高频无源标签芯片测试方法(草案)》的标准文本,并基于此标准草案组织了国内首次超高频无源标签芯片的比对测试。测试结果表明,目前国内自主研制的超高频无源标签芯片读灵敏度在高低温条件下可以做到小于-13dBm,写灵敏度小于-11dBm,最大工作功率大于20dBm,与国际主流芯片的指标仍存在提高的空间。通过对测试结果的分析,认为制定的测试方法基本可以全面反映芯片的性能,可以作为一种标准方法加以固化,供设计、生产、应用单位加以使用。The purpose of this paper is to standardize steps,conditions,influence factors and matters need attention in UHF passive RFID chip testing,which help to make a decision in standard drafting.By investigation into the need and present research situation of domestic UHF RFID chip,we summarized the experimental requirements of RFID chip＇s performance evaluation.＂UHF passive RFID chip testing methods（draft）＂is formed by working with several RFID design teams,which the first domestic UHF RFID chip test for comparison is based on.The results show that the read sensitivity performance of domestic chip can be less than-13 dBm in high and low temperature conditions,write sensitivity less than-11 dBm,and maximum power larger than 20 dBm,which still need to be improved to compare with international mainstream technology.Based on further analysis on test results,the standard test methods summarized in this paper can be used to evaluate the performance of the chip,and can be used in design,manufacture and application effectively.

关 键 词：超高频 无源标签芯片 读灵敏度 写灵敏度 

分 类 号：TN06[电子电信—物理电子学]