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作 者:林晓梅[1] 高丙川 林京君 Lin Xiaomei;Gao Bingchuan;Lin Jingjun(School of Electrical and Electronic Engineering, Changchun University of Technology, Changchun, Jilin 130012, China)
机构地区:[1]长春工业大学电气与电子工程学院,吉林长春130012
出 处:《激光与光电子学进展》2018年第2期296-300,共5页Laser & Optoelectronics Progress
基 金:国家自然科学基金(51374040);国家重点仪器专项(2014YQ120351)
摘 要:通过光谱成像及等离子体监测技术,研究了基于碳(C)元素的激光诱导击穿光谱(LIBS)技术,并对样品的烧蚀质量和重复加热进行了深入研究。研究结果表明,单双脉冲LIBS下的C元素的谱线强度明显不同。双脉冲信号增强的原因不只是烧蚀质量的增加,还在于双脉冲信号再次加热的物理变化使等离子体形成的环境发生了变化。The laser-induced breakdown spectroscopy (LIBS) based on the C element is investigated by the spectroscopic imaging and plasma monitoring techniques, and the ablation quality and repeated heating of the sample are studied in depth. The research results show that the spectral intensities of the C element under single and double pulse LIBS are obviously different. The double pusle signal enhancement is not only attributed to the increase of the ablation mass, but the change of plasma forming environment caused by the physical change of the double-pulse signal reheating.
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