电子产品可靠性增长试验综述  被引量:5

A Comprehensive Review on Reliability Growth Testing of Electronic Products

在线阅读下载全文

作  者:翁雷[1] 廖军[1] 孙国强[1] 

机构地区:[1]无锡江南计算技术研究所,无锡214083

出  处:《环境技术》2018年第1期20-23,共4页Environmental Technology

摘  要:可靠性增长试验是产品研制阶段提高其可靠性的一种试验手段,其目的是为了充分暴露产品潜在故障,分析故障原因,进而提出改进意见并验证改进的有效性。本文针对国产服务器设计上、工艺上存在的薄弱环节,对其进行可靠性增长试验研究,重点介绍可靠性增长试验方案设计中的关键要素,阐述可靠性增长试验方法及实施步骤,并针对国产服务器可靠性增长试验给出方案设计及应用案例。Reliability growth testing is a way to increase the reliability of electronic products in manufacturing period, its main purpose are discovering the failure, studying the failure causes and correcting the failure. The reliability growth testing was researched in allusion to the weakness parts of the domestic server on designing and manufacturing. The key factor was especially studied on the project designing of reliability growth testing. The reliability growth testing and the implement steps were expatiated. Aiming at the reliability growth testing of domestic server, the project designing and application cases were given.

关 键 词:可靠性增长试验 国产服务器 薄弱环节 

分 类 号:TP368.5[自动化与计算机技术—计算机系统结构]

 

参考文献:

正在载入数据...

 

二级参考文献:

正在载入数据...

 

耦合文献:

正在载入数据...

 

引证文献:

正在载入数据...

 

二级引证文献:

正在载入数据...

 

同被引文献:

正在载入数据...

 

相关期刊文献:

正在载入数据...

相关的主题
相关的作者对象
相关的机构对象