基于激光聚变的电子系统可靠性试验方法  

Electronic System Reliability Test Method Based on Laser Fusion Experiment

作　　者：易涛[1] 江少恩[1] 张保汉[1] 邓建红[2] 周开明[2] 曾超[2] 

机构地区：[1]中国工程物理研究院激光聚变研究中心 [2]中国工程物理研究院电子工程研究所

出　　处：《安全与电磁兼容》2018年第1期46-48,共3页Safety & EMC

摘　　要：提出一种基于激光聚变反应的电子系统可靠性试验方法。利用神光高功率激光装置在实验室环境下产生的极端辐射环境,能有效模拟电子系统所处的恶劣工作环境,检测其运行的可靠性,研究辐射对电子系统造成的损害。基于激光聚变反应的电子系统可靠性试验,具有极端辐射环境模拟能力强、实验设计灵活、配套测量技术发展成熟的技术优势,能提供在强电磁脉冲辐射、X射线辐射、中子辐射、带电粒子以及高速碎片等恶劣环境下的电子系统可靠性测试,可作为航天和航空电子系统研究的地面可靠性试验手段。We present an electronic system reliability test method based on laser fusion reaction. The controlled nuclear fusion reaction can be carried out at Shen Guang laser facility with harsh radiation generated. An electronic system reliability test can be implemented using the harsh radiation during nuclear fusion reaction and the damages of the electronic system induced by the harsh radiation can be carefully studied. This method is flexible with mature engineering technology and is most approaching a real harsh radiation environment such as outer space oraviation. It is promising to become an important reliability test method for aerospace or aeronautical electronic system test based on earth ground laboratory.

关 键 词：可靠性试验 神光激光装置 激光聚变 强辐射环境 

分 类 号：TN249[电子电信—物理电子学]