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作 者:赵晓亮[1,2] 赵屹东 唐坤[1] 郑雷[1] 刘树虎[1] 赵亚帅[3] 李凡 崔明启 ZHAO Xiaoliang;ZHAO Yidong;TANG Kun;ZHENG Lei;LIU Shuhu;ZHAO Yashuai;LI Fan;CUI Mingqi(Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China;University of Chinese Academy of Sciences, Beijing 100049, China;Academy of Opto-Electronics, Chinese Academy of Sciences, Beijing 100094, China)
机构地区:[1]中国科学院高能物理研究所,北京100049 [2]中国科学院大学,北京100049 [3]中国科学院光电研究院,北京100094
出 处:《核技术》2018年第4期9-16,共8页Nuclear Techniques
基 金:国家重大科学仪器专项(No.2012YQ130125);国家自然科学基金(No.11375227;No.U1632264)资助~~
摘 要:介绍了在北京同步辐射(Beijing Synchrotron Radiation Facility,BSRF)标定源的4B7B实验站上建立的一套软X光低温辐射计系统,用于测量从30 n W^1μW范围的软X光功率。经多次实验发现:热沉和吸收体的温度稳定性以及热辐射背底涨落的控制是降低X光功率测量不确定度的关键。热沉的温度稳定是吸收体温度稳定的前提;吸收体上电加热功率根据待测X光功率调节,通过温度控制系统实现;低功率下X光功率测量不确定度受热辐射背底涨落的影响较大,通过优化热沉和吸收体的温度控制系统以及改进热链接的设计及工艺,使热沉的温度标准差控制在10μK以下,吸收体的在15μK以下。通过改善吸收体和热沉的受热环境,以及对通光管做特殊设计,控制热辐射背底的涨落在0.06 n W以内。对30 n W光功率的测试结果显示测量不确定度小于1%(k=1)。[Background] There is no commercial soft X-ray cryogenic radiometer available for 4 B7 B experiment station on Beijing synchrotron radiation facility(BSRF). [Purpose] This study aims to design and implement a soft X-ray cryogenic radiometer to measure the X-ray power from 30 n W to 1 μW for BSRF. [Method] Intensive experiments were performed to find the key points to reduce the uncertainties of X-ray power measurement. The temperature stabilities of the heat sink, the absorber and the control of thermal radiation background fluctuation are principal factors influencing the accuracy whilst the temperature stability of the heat sink is the precondition of the absorber temperature stability. The heating power on the absorber is determined by the X-ray power and adjusted by the temperature control system. And for low X-ray power measurement, the uncertainties can be affected by the fluctuation of thermal radiation background. [Result Conclusion] Through optimizing the temperature control system of the heat sink and the absorber, and improving the design technics of the heat link, the standard deviation of the heat sink can be kept under 10 μK, and the absorber is kept under 15 μK. The fluctuation of thermal radiation background can be stabilized less than 0.06 n W by improving the thermal environment and design special light pipes. The result of 30 n W X-ray power measurement shows that total uncertainties are less than 1%(k=1).
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