L波段高功率微波对计算机的损伤效应试验研究  

Experimental Research on Damage Effects of L-Band High Power Microwave to Computer Equipments

作　　者：杨杰 李跃波 闫民华 黄刘宏 潘征 YANG Jie, LI Yue-bo, YAN Min-hua, HUANG Liu-hong, PAN Zheng(Troops 61489, PLA, Luoyang 471023, Chin)

机构地区：[1]中国人民解放军61489部队

出　　处：《微波学报》2018年第2期80-85,共6页Journal of Microwaves

摘　　要：高功率微波能对计算机等电子信息设备产生不同程度的损伤。利用高功率微波模拟试验系统,研究了L波段高功率微波对计算机主机和显示器的损伤效应,通过改变微波源和计算机设置,得到了损伤规律,分析了损伤机理,确定了受试样本的损伤阈值,并通过三参数威布尔函数法拓展得到了计算机类设备的损伤阈值范围。研究结果为计算机等电子信息设备对高功率微波的防护技术研究和防护标准规范制定提供了数据支撑和参考依据。High power microwave（ HPM） can damage electronic information equipments such as computer equipments differently degree. Based on the facilities utilized to undergo tests against L-band HPM,the paper studies experimentally the damage effects of computer equipments,chalks up equipments damage threshold through changing parameters of HPM and computer equipments,summarizes thoroughly the detailed damage mechanism and analyses damage rules. Based on these research result,threshold range of all kinds of computes are achieved through three-parameter Weibull distribution. The achievements in scientific research provide a scientific basis for the research on protective technology and protection regulations of computer equipments and other electronic information equipments.

关 键 词：L波段 高功率微波 计算机系统 损伤效应 

分 类 号：TN015[电子电信—物理电子学]