竞争失效产品恒定应力加速寿命试验的优化设计  

Optimum Constant-Stress Accelerated Life Tests with Competing Causes of Failure under Exponential Distribution

作　　者：葛广平[1] 刘立喜[2] 

机构地区：[1]上海大学理学院数学系,上海200072 [2]上海交通大学管理学院,上海200030

出　　处：《应用概率统计》2002年第3期260-268,共9页Chinese Journal of Applied Probability and Statistics

基　　金：国家自然科学基金资助项目.

摘　　要：本文在一般k个未知参数的加速寿命方程下,以各失效机理的对数平均寿命的MLE的渐近方差之和最小为准则,解决了指数分布场合下具有p（p≥1）个竞争机理的产品,k个应力情况下的恒加试验的优化设计问题,对它的结论从不同侧面特殊化,得到一系列推论,并与D.S.Bai,Y.R.Chun（1991）,D.S.Bai,M.S.Kim,S.H.Lee（1989）,R.Miller,W.B.Nelson（1983）,程依明（1994）等步加试验优化设计所得结论比较,可知所有结论都是对应的且有些结论是完全一致的.This paper persents optimum plans of constant-stress accelerated life tests with comoeting causes of failure, wihich life disrribution of each failure cause is assumed to be exponential. We obtain the optimum test designs to minimize the sum of asymptotic variance the Maximum Likelihood Estimation (MLE) of the log mean life in each cause at a design stress. A series of interesting results are shown in this paper, which are similar to or idential with those results shown in the optimum plans of step-stress accelerated life tests.

关 键 词：加速寿命试验 优化设计 恒加试验 竞争失效机理 渐近方差 

分 类 号：O212.6[理学—概率论与数理统计]