低速Xe^(q+)(4≤q≤20)离子与Ni表面碰撞中的光辐射  

Visible light emission from surface of nickel bombarded by slow Xe^(q+)(4≤q≤20) ion

作　　者：徐秋梅[1,2] 杨治虎 郭义盼[3] 刘会平 陈燕红 赵红赟 Xu Qiu-Mei;Yang Zhi-Hu;Guo Yi-Pan;Liu Hui-Ping;Chen Yan-Hong;Zhao Hong-Yun(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;University of Chinese Academy of Sciences, Beijing 100049, China;College of Astronautics, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China)

机构地区：[1]中国科学院近代物理研究所,兰州730000 [2]中国科学院大学,北京100049 [3]南京航空航天大学航天学院,南京210016

出　　处：《物理学报》2018年第8期57-64,共8页Acta Physica Sinica

基　　金：国家自然科学基金联合重点基金(批准号:U1732269)资助的课题~~

摘　　要：实验中测量了0.38V_(Bohr)(460 keV)高电荷态Xe^(q+)(4≤q≤20)离子轰击高纯Ni表面发射的400-510 nm光谱.实验结果包括NiⅠ原子谱线,NiⅡ离子谱线,以及入射离子中性化发射的XeⅠ,XeⅡ和XeⅢ谱线.研究了谱线XeⅡ410.419,XeⅢ430.444,XeⅡ434.200,XeⅡ486.254,NiⅠ498.245,NiⅠ501.697,NiⅠ503.502,NiⅠ505.061和NiⅠ508.293 nm的光子产额随着入射离子电荷态的变化.结果表明,入射离子中性化和溅射Ni原子发射谱线的光子产额随着入射离子电荷态的增加而增加,其趋势与入射离子势能一致.Bombarded by slow highly charged ion（SHCI）, particles including ions and atoms of metal are excited and ejected from the sample. Optical emission can be observed for the radiative de-excitation of some excited atomic particles.The important information about particle ejection and incident ion neutralization, as well as the nature, the kinetic energy, and the number of the sputtered excited particles can be obtained by studying the optical emission process.The optical emission from the the collisions between slow（V～0.38 V_（Bohr）） highly charged Xe^（q＋）（4≤q≤20） ions and high purity Ni（99.995%） surface is studied. The experiment is carried out at the 320 kV for multi-discipline research with HCIs in the Institute of Modern Physics, Chinese Academy of Sciences. The spectral lines are analyzed by using an Sp-2558 spectrometer equipped with a pattern of 1200 groves/mm blazed at 500 nm and an R955 photomultiplier tube at the exit slit. The target beam current corresponding to the dwell time is recorded, which can be translated into the incident ion current. Based on the formula of Y_λ=N_λ/（I_t/（C×e×q））,the spectral line intensity is normalized.The normalized spectrum can be obtained from the interaction of 0.38 V_（Bohr） Xe^（20＋） ions with Ni surface in a wavelength range of 400-510 nm. The species at excited state can be identified by comparing the wavelengths of spectral lines with those in the standard spectroscopic table. Most of the observed spectral lines are identified as being from the electron transitions of Ni Ⅰ 3 d^9（~2 D）4 p-3 d^9（~2 D_（5/2））4 d, Ni Ⅰ 3 d^8（~3 F）4 s4 p（~3 P°）-3 d^84 s（~4 F）5 s and Ni Ⅱ 3 p^63 d^9-3 p^63 d^8（~3 P）4 s, as well as Xe Ⅰ 5 p^5（~2 P°_（3/2））6 s-5 p^5（~2 P°_（3/2））8 p, Xe Ⅱ 5 p^4（~3 P_2）6 p-5 p^4（~3 P_2）6 d and Xe Ⅲ 5 s^25 p^3（~2 D）6 s-5 s^25 p^3（~2 D）6 p. Compared with the single charged ion, some neutralized incident ions yield Xe Ⅰ, Xe Ⅱ, Xe Ⅲ spect

关 键 词：高电荷态离子 可见光谱 光子产额 势能 

分 类 号：O562[理学—原子与分子物理]