二次电子发射特性测量装置的研究与进展  

Research and Development of the Measurement Equipment of Secondary Electron Emission

作　　者：苗光辉 崔万照[1] 杨晶[1] 张恒 MIAO Guanghui;CUI Wanzhao;YANG Jing;ZHANG Heng(Science and Technology on Space Microwave Laboratory,China Academy of Space Technology （Xi＇an）, Xi＇an 710000, China)

机构地区：[1]中国空间技术研究院西安分院,空间微波技术国家级重点实验室,西安710000

出　　处：《空间电子技术》2018年第1期25-32,41,共9页Space Electronic Technology

基　　金：国家自然科学基金(U1537211,61701394);空间微波技术重点实验室基金(6142411010101)

摘　　要：微放电效应出发引出对二次电子发射特性的研究,针对二次电子发射特性的测量,分析研究了当下通用的二次电子系数和能谱的测量方法。着重介绍了国内外具有代表性的重点科室其测量二次电子发射特性的装置,详细对比了不同装置二次电子特性测量的准确性和差异性,总结了各自的优势和不足。最后指出了目前二次电子测试平台装置急需解决的一些制约测试质量的问题和难点,以及在测量装置研究上进一步的发展方向及趋势。为更加深入地研究二次电子发射理论和数值模拟问题奠定坚实的实验基础。In this paper,for the measurement of the characteristics of secondary electron emission,the current measurement methods of the secondary electronic yield and energy spectra are analyzed and studied firstly. Then some kinds of representative devices are introduced compared in detail. The advantages and disadvantages are analyzed. Finally,the paper points out the problems and difficulties what restrict the testing quality of the devices,and the further development direction and trend of the measurement device research.It also lays an experimental foundation for studying the theory and numerical simulation of the secondary electron emission.

关 键 词：微放电 二次电子发射特性 测量装置 

分 类 号：V474[航空宇航科学与技术—飞行器设计]