柔性CuS透明导电薄膜的制备及性能表征  

Preparation and performance of flexible and transparent Cu S conductive film

作　　者：孙月月 吕丽云[1] 王虹[1] SUN Yueyue;Lü Liyun;WANG Hong(Key Laboratory for Green Chemical Technology of Ministry of Education, School of Chemical Engineering and Technology,Tianjin University,Tianjin 300350,Chin)

机构地区：[1]天津大学化工学院绿色合成与转化教育部重点实验室,天津300350

出　　处：《化工进展》2018年第6期2309-2315,共7页Chemical Industry and Engineering Progress

基　　金：国家自然科学基金项目(50673075)

摘　　要：采用化学浴沉积法,以硫酸铜和硫代乙酰胺为前体、乙二胺四乙酸二钠(EDTA-2Na)为铜离子络合剂,控制Cu和S元素的摩尔比为1∶2,在80℃下反应4h,于柔性衬底聚对苯二甲酸乙二醇酯(PET)上成功制备了Cu S透明导电薄膜。利用紫外可见分光光度计(UV-Vis)、X射线衍射仪(XRD)、场发射扫描电子显微镜(FESEM/EDS)、四探针测试仪以及薄膜导电性弯曲测试装置对Cu S透明导电薄膜进行了表征研究。结果表明,制备的导电薄膜由均匀致密六方型的Cu S纳米片组成,具有良好的导电性和透光率,且可根据不同的应用要求,通过改变反应条件方便地进行调控。Cu S透明导电薄膜的最低方块电阻值仅为20?/。经过250次大尺度弯曲实验,Cu S透明导电薄膜依然保持理想的导电能力。A transparent conductive copper sulfide film was prepared on a flexible substrate PET by chemical bath deposition method at 80℃ for 4 h with copper sulfate and thioacetamide as the precursors and EDTA-2 Na as the copper ion complexing agent. The molar ratio of Cu and S was 1∶2. The CuS conductive films were characterized by UV-Vis spectrophotometer（ UV-Vis）, X-ray diffraction diffractometer（XRD）,field emission scanning electron microscope（FESEM/EDS）,four-probe resistance analyzer and film bending test device. The results show that the as-prepared conductive films are composed of uniform and dense CuS hexagonal nanosheets,of which the conductivity and light transmittance can be easily controlled and adjusted by changing the reaction conditions according to different application requirements. The CuS transparent conductive films made under the optimized conditions,have a minimum resistance of 20Ω/□. After 250 times of large scale bending,the conductivity of the CuS transparent conductive film remains unchanged.

关 键 词：化学浴沉积 硫化铜 柔性 透明导电薄膜 

分 类 号：O649[理学—物理化学]