厚型气体电子倍增探测器(THGEM)在15～70 keV X射线测量中的应用  

The Measurement of the X-ray of 15～70 keV Using THGEM Detector

作　　者：阎明洋[1] 黄文谦 张帅[3] 马忠剑[1] 吴金杰[3] 谢一冈[1,2] YAN Ming-yang;HUANG Wen-qian;ZHANG Shuai;MA Zhong-jian;WU Jin-jie;XIE Yi-gang(Institute of High Energy Physics Chinese Academy of Science, Beijing 100049, China;Graduate University of Chinese Academy of Science, Beijing 100049, China;National Institute of Metrology, Beijing 100013, China)

机构地区：[1]中国科学院高能物理研究所,北京100049 [2]中国科学院大学,北京100049 [3]中国计量科学研究院,北京100013

出　　处：《核电子学与探测技术》2017年第11期1118-1122,共5页Nuclear Electronics & Detection Technology

摘　　要：本文采用了自主研发的THGEM探测器,其具有双膜结构,64路直流读出电子学等特点。采用该THGEM探测器在K荧光装置上,开展了对15~70 ke V内多能量点X射线的探测实验工作;结果显示该THGEM探测器对宽能区、高注量(剂量当量)的X射线具有良好线性响应,并分析了影响探测效率的因素。THGEM detector is independently developed with double membrane structure and direct current readout electronics of 64 channels. The THGEM detector is used to detect the different energies（ 15-70 ke V） of fluorescent X rays. The result shows the THGEM working well in linear response range under wide energy and high flux rate X-ray. The factors which affect the detection efficiency are analyzed.

关 键 词：THGEM 直流读出电子学 X射线 

分 类 号：O57[理学—粒子物理与原子核物理]