XRF分析中近距离探测X射线荧光强度计算修正方法  

Numerical Computation Method for Fluorescence Absolute Measurement with Semiconductor Detector

作　　者：刘旭[1] 黑东炜[1] 马戈[1] 魏福利[1] 罗剑辉[1] 夏惊涛[1] 唐波[1] LIU Xu;HEI Dong-wei;MA Ge;WEI Fu-li;LUO Jian-hui;XIA Jing-tao;TANG Bo(State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi＇an 710024, China)

机构地区：[1]强脉冲辐射环境模拟与效应国家重点实验室西北核技术研究所,西安710024

出　　处：《核电子学与探测技术》2017年第12期1260-1265,共6页Nuclear Electronics & Detection Technology

摘　　要：针对圆形探测面的半导体探测器,采用解析几何和角度积分的方法,对采用基本参数荧光强度表达式计算材料荧光绝对计数的方法进行了改进,获得了荧光绝对计数随样品厚度变化的曲线。实验测量不同厚度的铜箔的荧光计数与理论计算结果的相对偏差在6.21%以内,理论曲线与实验数据趋势相符,理论计算荧光绝对强度曲线在基于荧光绝对测量方法的厚度测量中具有一定的应用价值。A method based on basic parameters,for semi-conductor detector with circle surface to acquire absolute fluorescence count and curve of relationship between the count and sample thickness,is developed by analytical geometry and integral of angle. The relative deviation between the measured copper fluorescence count with different thickness and the result of theory is 6. 21% at most. The theoretical curve coincides with measurement results,which proves that the theoretical calculated curve of the relationship between fluorescence count and sample thickness is useful in thickness measurement based on absolute fluorescence measurement.

关 键 词：荧光分析 绝对测量 立体角 数值计算 

分 类 号：TL99[核科学技术—核技术及应用]