光致折射率微小变化的观测方法  

Observation Method of Slight Changes of Light Induced Refractive Index

作　　者：吴泽军 杨立森[1] Wu Zejun;Yang Lisen(Department of Physics and Electronic Information, Inner Mongolia Normal University Hohhot, Inner Mongolia 010022, China)

机构地区：[1]内蒙古师范大学物理与电子信息学院,内蒙古呼和浩特010022

出　　处：《激光与光电子学进展》2018年第6期350-356,共7页Laser & Optoelectronics Progress

基　　金：国家自然科学基金(60467002);内蒙古自然科学基金(2013MS0926)

摘　　要：光折变晶体内部产生的光致折射率的变化很小,不易实时观测,导致对写入晶格的质量无法鉴定。为了实时观测光折变光子晶格写入导致的更细微的光致折射率的时间和空间的变化,提出了在马赫-曾德尔光路的基础上引入放大的傅里叶变换的观测方法,极大地提高了测量的分辨率。该方法可以实时观测写入高密度光子晶格折射率的时间和空间变化,同时可以鉴定光子晶格的质量和均匀度,解决了高密度光子晶格制作质量的时间把控问题。与间接方法相比,该方法更加直观明了,所测数据更加准确、清晰,分辨率可方便地由傅里叶变换透镜的组合决定。The photorefractive index generated inside the photorefractive crystal has a very small change and is not easy observed in real time, resulting in the failure to characterize the quality of the writing lattices. In order to observe the temporal and spatial variation of the photorefractive index caused by the writing of photorefractive photonic lattice, we propose amplified Fourier transform method based on Mach-Zehnder optical path. The resolution of the measurement is greatly improved. This method can observe the time and space changes of refractive index of high density photonic lattice in real time, at the same time, it can identify the quality and uniformity of photonic lattice, and solve the time control problem of high density photonic lattice fabrication quality. Compared with the indirect method, the proposed method is more straightforward, the measured data is more accurate and clear, and the resolution can be easily determined by the combination of Fourier transform lens.

关 键 词：非线性光学 马赫-曾德尔干涉仪 傅里叶变换 LINBO3晶体 光折变光子晶格 

分 类 号：O437[机械工程—光学工程]