某型高压电容裂纹失效原因与措施  

Analysis of the High Voltage Capacitance Crack

作　　者：杜娟娜 穆仕博[2] Du Juan-na;Mu Shi-bo(China Airbrone Missile Academy,Henan Luoyang 471099;China Airbrone Missile Academy Military Representative Office,Henan Luoyang 471099)

机构地区：[1]中国空空导弹研究院,河南洛阳471099 [2]驻中国空空导弹研究院军事代表室,河南洛阳471099

出　　处：《电子质量》2018年第5期17-18,23,共3页Electronics Quality

摘　　要：该文通过对某型高压电容自身特点、装配使用工艺进行分析,确定了高压电容在温度冲击后出现裂纹的原因,通过细化装配工艺,采取必要的保护措施,有效地避免了生产过程中类似故障的再次发生。Based on the analysis of the characteristics of a high voltage Capacitance and the assembly process,the causes of the crack occurred after the temperature shock are determined,and the necessary protective measures are adopted to avoid the recurrence of similar faults in the production process.

关 键 词：空空导弹 可靠性增长 实施 

分 类 号：TM53[电气工程—电器]