嵌入式电子信息系统可靠度优化  

Reliability optimization of embedded electronic information system

作　　者：潘晓贝[1] PAN Xiao-bei(Sanmenxia Polytechnic Sanmenxia 472000, Chin)

机构地区：[1]三门峡职业技术学院,河南三门峡472000

出　　处：《安徽水利水电职业技术学院学报》2018年第2期44-47,共4页Journal of Anhui Technical College of Water Resources and Hydroelectric Power

摘　　要：文章分析了影响嵌入式电子系统可靠度的主要因素,并从系统平均寿命、失效率、故障密度函数、可用度等几方面展开研究,提出了对应的可靠度优化模型,通过仿真实验证实了该模型的可行性,可以显著实现对嵌入式电子信息系统可靠度的优化。This paper analyzes the main factors affecting the reliability of the embedded electronic system,and studies the system＇s average life,inefficiency,fault density function,availability and so on,and puts forward the corresponding reliability optimization model.The feasibility of the model is proved by the simulation experiment,and the reliability of the embedded electronic information system can be optimized significantly.

关 键 词：嵌入式 电子信息系统 可靠度 优化模型 仿真实验 

分 类 号：TP14[自动化与计算机技术—控制理论与控制工程]