基于相邻像素统计一致性的非均匀性校正方法  

Nonuniformity Correction Method Based on Statistical Consistency of Adjacent Pixels

作　　者：刘亚梅[1] LIU Ya-mei(Mechanical and Electrical Engineering, Changchun University of Technology, Changchun 130012, China)

机构地区：[1]长春工业大学机电工程学院,长春130012

出　　处：《光子学报》2018年第7期30-38,共9页Acta Photonica Sinica

基　　金：吉林省科技厅自然科学基金(No.20160101340JC)资助~~

摘　　要：为了校正长波红外探测器辐射响应非均匀性,提出了一种基于相邻像素统计一致性的非均匀性校正方法.首先,对探测器辐射响应非均匀性建模;然后,利用均值算子估计相邻像素之间的比值,并递推求解校正系数;最后,搭建了原理样机对多种不同场景成像.实验结果表明:与基于黑体的标定方法相比,利用本文方法校正后的图像粗糙度由1.27×10^(-2)降低至1.13×10^(-2),局部标准差峰值由10.5降低至3.5,可以有效降低红外探测器非均匀性噪声.To correct the nonuniformity of long-wave infrareddetectors,a nonuniformity correction method based on statistical consistency of adjacent pixels is proposed.First,the model of radiance nonuniformity is introduced.Then,the ratio between adjacent pixels is estimated with a mean operator,and the correction coefficients are calculated iteratively.Finally,aprinciple prototype is set up to grab different scenes.Experimental results demonstrate that the proposed method can decrease the roughness of the corrected images from 1.27×10^（-2） to 1.13×10^（-2）,and the local standard deviation from 10.5 to 3.5,compared with the calibration-based method.The proposed method can reduce nonuniformity noise of infrared detectors effectively.

关 键 词：光电探测 非均匀性校正 相邻像素统计特性 红外焦平面阵列 相对辐射定标 

分 类 号：TP751.1[自动化与计算机技术—检测技术与自动化装置]