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作 者:Lu Liu Yong Su Jing-Ping Xu Yi-Xian Zhang 刘璐;苏勇;徐静平;张贻贤(School of Optical and Electronic Information, Huazhong University of Science and Technology)
机构地区:[1]School of Optical and Electronic Information, Huazhong University of Science and Technology
出 处:《Chinese Physics Letters》2018年第6期102-105,共4页中国物理快报(英文版)
基 金:Supported by the National Natural Science Foundation of China under Grant No 61404055
摘 要:Nano-floating gate memory devices with ZnO nano-crystals as charge storage layers are fabricated,and the influence of post-deposition annealing temperature and thickness of the ZnO layer are investigated.Atomic force microscopy and scanning electron microscopy reveal the morphology of discrete ZnO nano-crystals.For capacitance-voltage measurements,it is found that the memory device with 1.5 nm ZnO and annealed at 700℃shows a larger memory window of 4.3 V(at±6 V)and better retention characteristics than memoriy devices with2.5 nm ZnO or annealed at other temperatures.These results indicate that the nano-floating gate memory with ZnO nano-crystals can obtain good trade-off memory properties.Nano-floating gate memory devices with ZnO nano-crystals as charge storage layers are fabricated,and the influence of post-deposition annealing temperature and thickness of the ZnO layer are investigated.Atomic force microscopy and scanning electron microscopy reveal the morphology of discrete ZnO nano-crystals.For capacitance-voltage measurements,it is found that the memory device with 1.5 nm ZnO and annealed at 700℃shows a larger memory window of 4.3 V(at±6 V)and better retention characteristics than memoriy devices with2.5 nm ZnO or annealed at other temperatures.These results indicate that the nano-floating gate memory with ZnO nano-crystals can obtain good trade-off memory properties.
关 键 词:ZNO Fabrication and Characteristics of Nano-Floating Gate Memories with ZnO Nano-Crystals as Charge-Storage Layer
分 类 号:TB383[一般工业技术—材料科学与工程] O4[理学—物理]
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