基于PST的杂散光测试系统研究  

Research on Stray Light Measurement System Based on PST

作　　者：吴琪 徐熙平[1] 徐亮[2] 陈君杰 WU Qi;XU Xiping;XU Liang;CHEN Junjie(School of Optoelectronic Engineering,Changchun University of Science and Technology,Changchun 130022;Xi’an Institute of Optics and Precision Mechanics,Chinese Academy of Sciences,Xi’an 710119)

机构地区：[1]长春理工大学光电工程学院,长春130022 [2]中国科学院西安光学精密机械研究所,西安710119

出　　处：《长春理工大学学报（自然科学版）》2018年第3期16-21,共6页Journal of Changchun University of Science and Technology(Natural Science Edition)

摘　　要：杂散光的研究是保障光学系统高质量成像的关键因素之一。为了保证测试可靠性,首先提出光束性能测试的方法,满足测试所需要求。建立一个大口径的杂散光测试实验装置,对可见光、红外光波段进行测试及分析。然后利用光电倍增管对微弱信号进行提取,提高PST测试范围的数量级,并对探测器响应曲线进行分析。最后测试过程中,在不同离轴角度下,通过测试系统的实际测量值和标准相机得到的标准值进行对比,系统地论述测试系统存在误差的因素。改进后系统的PST测试曲线整体成下降趋势,PST在离轴角度为±3°时可达到10^(-3)~10^(-4),表明系统对杂散光的抑制能力完全满足成像质量要求。The study of stray light is one of the key factors to ensure high quality imaging of optical systems. To assure the more test reliablity and be able to test the beam properties,an equipment are set up which is a arge aperture stray light test device,to examine and analyze the kinds of visible lights and infrared lights.Using the technology of photomultiplier and phase-locked amplifier to extract weak signals,the Point Source Transmittance（PST） magnitude order of the test range can be obviously improved,and the detector response curve is analyzed.During the testing process,at different off-axis angles,the real values passed the testing system with the standard values can be compared and the reasons where the deviation exists are analyzed. After making the PST testing system better,the test curve of the improved PST system shows a downward trend as a whole;PST can reach 10^（-3）~ 10^（-4） when the off-axis angle is± 3°which show that the system＇s ability to suppress stray light fully meets the imaging quality requirements.

关 键 词：光学测量 杂散光 点源透过率系统 离轴角度 

分 类 号：TN216[电子电信—物理电子学]