微型X射线管最佳入射角及Be窗厚度的MC模拟  

Monte Carlo Simulation to Determine Optimum Incident Angle and Be-window Thicknesses for Micro X-ray Tube

作　　者：黄凯[1,2] 刘良柱 颜瑜成[2] 徐志勇 钟丁生 HUANG Kai;LIU Liang-zhu;YAN Yu-cheng;XU Zhi-yong;ZHONG Ding-sheng(Chengdu University of Technology College of Engineering Technology,Leshan Sichuan 614000,China;Southwest Institute of Physics,Chengdu 610225,China)

机构地区：[1]成都理工大学工程技术学院,四川乐山614000 [2]核工业西南物理研究院,成都610225

出　　处：《核电子学与探测技术》2018年第1期100-104,共5页Nuclear Electronics & Detection Technology

基　　金：成都理工大学青年科学基金(C122016010);乐山市科技局项目(17GZD044)资助

摘　　要：利用MC法针对50 ke V电子束面源、2μm银靶、250μm铍窗的微型X射线管进行模拟研究,讨论电子入射角对微型透射式X射线管的出射谱线及各项评价指标的影响。结果表明,电子的最佳入射角在40°左右;并在最佳电子入射角的情况下,确定Be窗最优厚度为500μm。与传统的X射线管相比,在调节电子入射角、优化Be窗厚度后的X射线管的出射谱线中,中低能的X射线总计数的减少比例高于高能部分,减小了对待测元素的特征X射线的干扰,增加了原级特征X射线在中高能轫致辐射的相对比重,提高了EDXRF分析的精度与准确性。This work aims at simulating surface source with 50 keV of electron beam, 2 um of silver target and micro X-ray tube with 250 um of beryllium window by using MC method. It examined the effects of electron incident angle to micro X-ray beam line spectroscopy and various evaluation indexes. The results show the optimum conditions that incident angle is at around 40 degrees and the thickness of Be window is 500 um under this condition. In comparison with traditional X-ray tube the loss counts of medium and low energy X-ray is relatively less than high energy under the optimum incident angle and Be window, which reduces interruptions to characteristic X-ray of measured elements and enhances weighted factor of original X-ray in medium and high energy bremsstrahlung radiation, thus improves the accuracy and precision of EDXRF analysis.

关 键 词：微型x射线管 电子入射角 射束硬化 MC模拟 

分 类 号：TL1[核科学技术—核能科学]