Design and comparison of new fault-tolerant majority gate based on quantum-dotcellular automata  

作　　者：xiaoyang wang guangjun xie feifei deng yu quan hongjun lü 

机构地区：[1]School of Electronic Science & Applied Physics, Hefei University of Technology, Hefei 230009, China

出　　处：《Journal of Semiconductors》2018年第8期62-69,共8页半导体学报（英文版）

基　　金：supported by the National Natural Science Foundation of China(No.61271122)

摘　　要：Quantum-dot cellular automata(QCA) is increasingly valued by researchers because of its nanoscale size and very low power consumption. However, in the manufacture of nanoscale devices prone to various forms of defects, which will affect the subsequent circuits design. Therefore, fault-tolerant QCA architectures have become a new research direction. The purpose of this paper is to build a novel fault-tolerant three-input majority gate based on normal cells. Compared with the previous structures, the majority gate shows high fault tolerance under single-cell and double-cell omission defects. In order to examine the functionality of the proposed structure, some physical proofs under single cell missing defects are provided. Besides, two new fault-tolerant decoders are constructed based on the proposed majority gate. In order to fully demonstrate the performance of the proposed decoder, the previous decoders were thoroughly compared in terms of fault tolerance, area and delay. The result shows that the proposed design has a good fault tolerance characteristic, while the performance in other aspects is also quite good.Quantum-dot cellular automata(QCA) is increasingly valued by researchers because of its nanoscale size and very low power consumption. However, in the manufacture of nanoscale devices prone to various forms of defects, which will affect the subsequent circuits design. Therefore, fault-tolerant QCA architectures have become a new research direction. The purpose of this paper is to build a novel fault-tolerant three-input majority gate based on normal cells. Compared with the previous structures, the majority gate shows high fault tolerance under single-cell and double-cell omission defects. In order to examine the functionality of the proposed structure, some physical proofs under single cell missing defects are provided. Besides, two new fault-tolerant decoders are constructed based on the proposed majority gate. In order to fully demonstrate the performance of the proposed decoder, the previous decoders were thoroughly compared in terms of fault tolerance, area and delay. The result shows that the proposed design has a good fault tolerance characteristic, while the performance in other aspects is also quite good.

关 键 词：quantum-dot cellular automata(QCA) DEFECTS fault-tolerant three-input majority gate DECODERS 

分 类 号：TN764[电子电信—电路与系统] TN304.23