金属化膜电容器元件自愈失败过程研究  

Study on Self-healing Failure Process in Metallized Film Capacitor Element

作　　者：王荀[1] 陈伟 徐梦蕾[1] 徐志钮[1] 王子建[1] 尹婷 周志成 WANG Xun;CHEN Wei;XU Menglei;XU Zhiniu;WANG Zijian;YIN Ting;ZHOU Zhieheng(Hebei Provincial Key Laboratory of Power Transmission Equipment Security Defense,North China Electric Power University,Hebei Baoding 071003,China;State Grid Corporation of China,Beijing 100031,China;China Electric Power Reseamh Institute,Beijing 100191,China;State Grid jiangsu Electric Power Co.,Ltd.,Nanjing 211103,China)

机构地区：[1]华北电力大学河北省输变电设备安全防御重点实验室,河北保定071003 [2]国家电网有限公司,北京100031 [3]中国电力科学研究院有限公司,北京100191 [4]国网江苏省电力有限公司,南京211103

出　　处：《电力电容器与无功补偿》2018年第4期54-58,共5页Power Capacitor & Reactive Power Compensation

基　　金：国家电网公司科技项目(GY71-17-010)

摘　　要：金属化膜电容器的自愈性虽能在发生局部击穿时自动恢复绝缘,但持续性放电引发自愈失败仍能导致灾难性故障的发生。为探其自愈失败过程,对电容器元件施加较高直流电压,通过并联电容间接测量击穿点处的电压和电流,分析自愈失败时的发展过程,推导其击穿点的阻抗特性。试验结果表明:自愈失败是以一个较大的自愈过程为先导,在元件彻底击穿之前,会有持续时间为几毫秒的频繁自愈过程,这些自愈电流的峰值随电压的减小而下降;在元件彻底击穿的过程中,随着持续放电的进行,击穿点的等效电阻在逐渐减小,阻值最小值已基本接近完全短路。本文通过对自愈失败过程的研究,为熔丝保护和安全膜设计提供参考。Although the self-healing metallized film capacitor recovers insulation automatically in case of partial breakdown,yet self-healing failure due to sustaining discharge can still lead to occurrence of failure caused by sustained discharge still leads to catastrophic fault. For exploring self-healing failure process,HVDC voltage is applied on the capacitor element,the voltage and current at the breakdown point is measured indirectly by the shunt capacitor so to analyze the development process of the self-healing failure and deduce the impedance feature of its breakdown point. It is shown by the test result that the self-healing failure is the bigger self-healing process as a lead,the frequent self-healing process with sustaining time of several ms is existed before complete breakdown of the element,and the peak of these self-healing current decreases with decreasing voltage. During the breakdown period of element,with the sustaining discharge,the equivalent resistance of the breakdown point is reduced gradually and the minimum resistance is basically close to complete short circuit. The study of the self-healing failure process provides reference for the fuse protection and safe film design.

关 键 词：金属化膜电容器 自愈失败 阻抗特性 

分 类 号：TM53[电气工程—电器]