低压元件的温升测量方法评定  

Evaluation of Temperature Rise Measurement Method for Low Voltage Components

作　　者：薛昊 XUE Hao(Tianjin Institute of Electrical Technology,Tianjin 30023)

机构地区：[1]天津市电工技术科学研究院,天津300232

出　　处：《天津冶金》2018年第3期55-57,共3页Tianjin Metallurgy

摘　　要：通过万能式断路器的温升试验,比对使用铜排连接与软线连接的差异,运用不确定度分析方法对试验数据进行分析。通过计算得出:采用进线软线、出线铜排的不确定度为0.1414;采用进线铜排、出线铜排的不确定度为0.1224。对于低压电气元件的温升试验,可以使用铜排与铜排连接,也可以使用铜排与软线连接,两种试验方式所得试验结果可以近似相等。TThrough the temperature rise test of the universal circuit breaker, the test data are analyzed by using the uncertainty analysis method to compare the difference between the copper bar connection and the soft wire connection. Through calculation, it is concluded that the uncertainty of copper row is 0.1414 when soft wire is used, and 0.12244 when copper bar is used. For the temperature rise test of low voltage electrical components, the two connect manner of copper bar with copper bar and copper bar with soft wire can be used, and the results of the two test methods can be approximately equal.

关 键 词：万能断路器 温升试验 不确定度 分析 

分 类 号：TM561[电气工程—电器]