一种测量微波介质基板复介电常数的方法  

A method for measuring complex permittivity of microwave dielectric substrate

作　　者：吴秉琪 刘长军[1] WU Bingqi;LIU Changjun(School of Electronics and Information Engineering,Sichuan University,Chengdu 610064,China)

机构地区：[1]四川大学电子信息学院,四川成都610004

出　　处：《应用科技》2018年第4期100-103,共4页Applied Science and Technology

基　　金：国家自然科学基金项目(NSFC 61271074)

摘　　要：为了测量微波介质基板的复介电常数,提出了一种基于微带线测量的方法。通过使用微带线相关理论模型和电磁场仿真软件计算微带线辐射损耗,编写相应的计算机程序可以测得微波介质基板的复介电常数。在测量中,通过使用除长度外其他参数均相同的2条微带线的测量数据进行计算,减弱了由于实际测量中引入同轴接头而产生的测量误差。对多种常见的微波介质基板进行了测量,结果表明:与标称值相比,介电常数实部误差为1%左右,损耗角正切误差为10%左右,该测量方法切实可行和精确性高。In this paper, a measurement method is proposed to measure the complex permittivity of the microwave dielectric substrate,. The microstrip radiative loss was calculated by relevant theoretical model of microstrip and electromagnetic field simulative soft, and the complex permittivity of microwave dielectric substrate could be measured by corresponding computer programme. The errors from the coaxial connectors were compensated by measuring two microstrips, which have the same parameters except length. Various common microwave dielectric substrates were measured. The results show that the error of real part of permittivity is about 1%, and the loss tangent measurement error is about 10%. The proposed method is valid and accurate in practice.

关 键 词：微带线 印刷电路板 微波测量 介电常数测量 损耗角正切 辐射损耗 有效介电常数 宽频带测量 

分 类 号：TN972[电子电信—信号与信息处理]